"Many exciting areas of research require observing the dynamics of nanoscale systems. Researchers from around the world use XM-1's unique combination of 10-nm spatial resolution and 70-ps temporal resolution to study nanoscale properties that are challenging or impossible to see in other ways."
Mi Young Im,
XM-1 combines: spatial resolution approaching 10 nm, elemental specificity, 70 ps temporal resolution (set by the bunch length of the x-ray pulses), and high sensitivity to spin configurations (via dichroism effects with polarized x-rays) making it a unique analytical tool for nanoscience research. Every day, scientists working in areas such as spintronics, nanoscale materials science, x-ray optics and environmental sciences come to XM-1 to unlock nanoscale properties that are challenging or impossible to see in other ways.
|Energy range||500-1300 eV|
|Flux||Images with 1000 x 1000 pixels, 1000 photons/pixel recorded in 3 s at 517 eV with 0.2% BW (ALS at 1.9 GeV, 400 mA)|
|Spectral resolution (E/ΔE)||500-700|
|Spatial resolution||Typical 25 nm (best value 10 nm)|
|Field of view||15 µm single field; virtually unlimited larger areas can be tiled together like a mosaic|
|Detector||Back-thinned 2048- x 2048-pixel CCD camera|
|Equipment||Various fast electronic pulsers for spin dynamics, fast sampling oscilloscope, polarization selecting aperture|
|Format||Thin films deposited typically on Si3N4 membrane (similar to TEM substrates) or other x-ray-transparent substrates|
|Environment||External magnetic fields up to 5 kOe in beam direction and 2 kOe along the sample plane; tilted sample holder for in-plane magnetized samples; He at atmospheric pressure, wet or dry|
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