"Mirrors and detectors are the foundation of soft
x-ray science. We routinely measure the reflectivity and scattering properties of the most advanced x-ray and EUV optics in the world."
CXRO Reflectometer Principal Investigator
The CXRO Reflectometer serves as a worldwide reference standard. Its high accuracy and un- rivaled precision enable it to characterize the fundamental optical properties of materials, the quality of optical elements, the efficiency of grating spectrometers, the scattering properties of ultra-smooth surfaces, and the sensitivity of detectors, at EUV and soft x-ray wavelengths.
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